Studying the Optical and Structural Properties of Cadmium Oxide Thin Films Prepared by Successive Ionic Layer Adsorption and Reaction (SILAR) Technique

Abstract

     Cadmium oxide CdO thin films were prepared by successive ionic layer adsorption and reaction (SILAR) technique at varying number of dippings. The CdO thin films were prepared from a source material of Cadmium acetate and ammonium hydroxide solution deposited on glass substrate at 95℃.    The prepared thin films were investigated by X-ray diffraction (XRD), Atomic force microscopy (AFM), Scanning Electron Microscopy (SEM), Fourier Transform Infrared (FTIR), and UV-Visible spectrometry. The XRD analysis reveals that the films were polycrystalline with cubic structure having preferential orientation along (1 1 1), (2 0 0), (2 2 0), and (3 1 1) planes. While the tests of the scanning electron microscopy and the atomic force microscopy indicate that the thin films are homogeneous and free of voids.

Key words :thin films,  SILAR ,X-ray diffraction,. 0ptical and structural properties