Structural and Morphological Properties of As-Deposited and Heat Treated Blended Graphene Oxide / Poly(3,4-Ethylenedioxythiophene)-Poly(Styrenesulfonate) Thin Films

Authors

  • Saja Qasim Department of Physics, College of Science, University of Baghdad, Baghdad, Iraq
  • Ameer F. AbdulAmeer Department of Physics, College of Science, University of Baghdad, Baghdad, Iraq
  • Ali H A Jalaukhan Department of Physics, College of Education for Pure Science, 2University of Kerbala, Kerbala, Iraq

DOI:

https://doi.org/10.24996/ijs.2021.62.11(SI).22

Keywords:

Organic semiconductor, Go, PSS, Structural and Morphological

Abstract

    In this study the as-deposited and heat treated at 423K of conductive blend graphene oxide (GO)/ poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) thin films was prepared with different PEDOT:PSS concentration (0, 0.25, 0.5, 0.75 and 1)w/w on pre-cleaned glass substrate by spin coater. The XRD analysis indicate the existence of the preffered peak (001) of GO around 2θ=8.24° which is domain in all GO/ PEDOT:PSS films characterized for GO, this result approve the good quality of the PEDOT:PSS dispersion in GO, this peak shifted to the lower 2θ with increasing PEDOT:PSS concentration and after annealing process. The scanning electron microscopy (SEM) images and atomic force microscopy (AFM) clearly show the GO flakes and go to disappear with increasing the PEDOT:PSS concentration. 

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Published

2021-12-23

How to Cite

Structural and Morphological Properties of As-Deposited and Heat Treated Blended Graphene Oxide / Poly(3,4-Ethylenedioxythiophene)-Poly(Styrenesulfonate) Thin Films. (2021). Iraqi Journal of Science, 62(11), 4416-4424. https://doi.org/10.24996/ijs.2021.62.11(SI).22

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