The Potential Barrier and Thermal Stability Dependence on PI Thickness of Al/PI/c-Si Schottky Diode. Iraqi Journal of Science, [S. l.], v. 61, n. 12, p. 3235–3241, 2020. DOI: 10.24996/ijs.2020.61.12.12. Disponível em: https://ijs.uobaghdad.edu.iq/index.php/eijs/article/view/3131.. Acesso em: 4 dec. 2024.